- 状態 :
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16 プロダクト
| 絵 | モデル | 価格 | 数量 | 株式 | メーカー | 説明 | シリーズ | 状態 | 包装 | 作動温度 | マウントタイプ | パッケージ/ケース | 供給装置パッケージ | 供給電圧 | ビット数 | 論理タイプ | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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見積もりを取得 |
1,273
在庫あり
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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見積もりを取得 |
3,734
在庫あり
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NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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見積もりを取得 |
2,912
在庫あり
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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見積もりを取得 |
2,644
在庫あり
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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見積もりを取得 |
3,343
在庫あり
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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見積もりを取得 |
2,089
在庫あり
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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見積もりを取得 |
827
在庫あり
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ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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見積もりを取得 |
1,191
在庫あり
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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見積もりを取得 |
713
在庫あり
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Texas Instruments | IC SCAN TESST DEVICE 28-SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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見積もりを取得 |
840
在庫あり
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Texas Instruments | IC SCAN TESST DEVICE 28-SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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見積もりを取得 |
2,761
在庫あり
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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見積もりを取得 |
1,260
在庫あり
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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見積もりを取得 |
1,785
在庫あり
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Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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見積もりを取得 |
1,363
在庫あり
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Texas Instruments | IC SCAN TEST DEV/TXRX 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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見積もりを取得 |
2,599
在庫あり
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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見積もりを取得 |
3,118
在庫あり
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers |
