- 状態 :
- 論理タイプ :
-
- Addressable Scan Ports (8)
- Parity Generator/Checker (12)
- Scan Test Device with Bus Transceiver and Registers (15)
- Scan Test Device with Bus Transceivers (12)
- Scan Test Device with Inverting Bus Transceivers (8)
- Scan Test Device with Registered Bus Transceiver (15)
- Scan Test Device With Transceivers And Registers (2)
- Scan Test Device with Universal Bus Transceivers (4)
- 選択したフィルタ :
76 プロダクト
| 絵 | モデル | 価格 | 数量 | 株式 | メーカー | 説明 | シリーズ | 状態 | 包装 | 作動温度 | マウントタイプ | パッケージ/ケース | 供給装置パッケージ | 供給電圧 | ビット数 | 論理タイプ | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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見積もりを取得 |
2,850
在庫あり
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SO | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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見積もりを取得 |
1,273
在庫あり
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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見積もりを取得 |
3,734
在庫あり
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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見積もりを取得 |
1,356
在庫あり
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SO | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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|
見積もりを取得 |
3,163
在庫あり
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28PLCC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.51x11.51) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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|
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見積もりを取得 |
1,560
在庫あり
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28PLCC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.51x11.51) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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|
|
見積もりを取得 |
3,665
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
1,958
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
3,125
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
見積もりを取得 |
3,642
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | ||
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見積もりを取得 |
1,244
在庫あり
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 160-NFBGA (9x13) | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||
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見積もりを取得 |
3,918
在庫あり
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||
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見積もりを取得 |
2,859
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
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|
|
見積もりを取得 |
3,739
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
2,912
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
2,644
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
3,343
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SSOP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
2,054
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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|
|
見積もりを取得 |
1,328
在庫あり
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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|
|
見積もりを取得 |
1,328
在庫あり
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
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|
|
見積もりを取得 |
2,704
在庫あり
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,543
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
962
在庫あり
|
Texas Instruments | IC SCAN TEST DEV/TXRX 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
見積もりを取得 |
2,438
在庫あり
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28PLCC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.5x11.5) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
|
|
|
見積もりを取得 |
1,269
在庫あり
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
|
|
|
見積もりを取得 |
3,305
在庫あり
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28PLCC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-LCC (J-Lead) | 28-PLCC (11.5x11.5) | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
|
|
|
見積もりを取得 |
2,089
在庫あり
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SSOP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
|
|
|
見積もりを取得 |
827
在庫あり
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SSOP | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SSOP (0.209", 5.30mm Width) | 28-SSOP | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
|
|
|
見積もりを取得 |
3,911
在庫あり
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
|
|
|
見積もりを取得 |
2,269
在庫あり
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Obsolete | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports |
