- パッケージ/ケース :
- 供給装置パッケージ :
- 選択したフィルタ :
25 プロダクト
| 絵 | モデル | 価格 | 数量 | 株式 | メーカー | 説明 | シリーズ | 状態 | 包装 | 作動温度 | マウントタイプ | パッケージ/ケース | 供給装置パッケージ | 供給電圧 | ビット数 | 論理タイプ | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
見積もりを取得 |
2,075
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
見積もりを取得 |
3,173
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
見積もりを取得 |
728
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,042
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
737
在庫あり
|
Texas Instruments | IC 20BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
930
在庫あり
|
Texas Instruments | IC 18BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,889
在庫あり
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,889
在庫あり
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,212
在庫あり
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
1,952
在庫あり
|
Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
見積もりを取得 |
854
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
見積もりを取得 |
3,631
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
見積もりを取得 |
1,601
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,042
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,851
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
1,437
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,170
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,513
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,798
在庫あり
|
Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,679
在庫あり
|
Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,657
在庫あり
|
Texas Instruments | IC 20BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
見積もりを取得 |
2,299
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,238
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,276
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-TSSOP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
1,043
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers |
