- シリーズ :
- 状態 :
- 論理タイプ :
-
- ABT Scan Test Device With Transceivers and Registers (5)
- ABT Scan Test Device With Universal Bus Transceivers (17)
- Linking Addressable Scan Ports (1)
- Scan Test Device with Registered Bus Transceiver (2)
- Scan Test Device With Transceivers And Registers (6)
- Scan Test Device with Universal Bus Transceivers (4)
35 プロダクト
| 絵 | モデル | 価格 | 数量 | 株式 | メーカー | 説明 | シリーズ | 状態 | 包装 | 作動温度 | マウントタイプ | パッケージ/ケース | 供給装置パッケージ | 供給電圧 | ビット数 | 論理タイプ | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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見積もりを取得 |
3,479
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
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見積もりを取得 |
2,075
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
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|
|
見積もりを取得 |
3,173
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
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|
|
見積もりを取得 |
2,859
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,739
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
見積もりを取得 |
728
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,042
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
737
在庫あり
|
Texas Instruments | IC 20BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
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|
|
見積もりを取得 |
930
在庫あり
|
Texas Instruments | IC 18BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
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|
|
見積もりを取得 |
2,710
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
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|
|
見積もりを取得 |
1,147
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,889
在庫あり
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,889
在庫あり
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
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|
|
見積もりを取得 |
3,212
在庫あり
|
Texas Instruments | IC 18BIT SCAN TST DEV UBT 64LQFP | 74LVTH | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
1,771
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
見積もりを取得 |
3,544
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
見積もりを取得 |
2,346
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
見積もりを取得 |
3,989
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
見積もりを取得 |
1,253
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
見積もりを取得 |
1,851
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
見積もりを取得 |
1,952
在庫あり
|
Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
見積もりを取得 |
854
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
見積もりを取得 |
3,631
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
見積もりを取得 |
722
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,133
在庫あり
|
Texas Instruments | IC LINK ADDRSS SCAN-PORT 64-LQFP | 74LVT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | - | Linking Addressable Scan Ports | ||
|
|
|
見積もりを取得 |
1,601
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,042
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
3,851
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
1,437
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | 74LVTH | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,170
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TRANSCVR 64LQFP | 74LVTH | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers |
