- 作動温度 :
- 供給装置パッケージ :
- 論理タイプ :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (4)
- Addressable Scan Ports (6)
- Arithmetic Logic Unit (6)
- Buffer/Driver with Parity (2)
- Embedded Test-Bus Controllers (6)
- Scan Test Device with Buffers (3)
- Scan Test Device with Bus Transceivers (7)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (4)
- Scan Test Device with D-Type Latches (4)
- Scan Test Device with Inverting Buffers (4)
- Voltage Clamp (4)
50 プロダクト
| 絵 | モデル | 価格 | 数量 | 株式 | メーカー | 説明 | シリーズ | 状態 | 包装 | 作動温度 | マウントタイプ | パッケージ/ケース | 供給装置パッケージ | 供給電圧 | ビット数 | 論理タイプ | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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|
見積もりを取得 |
1,582
在庫あり
|
NXP USA Inc. | IC BUFFER/LDRIVER OCTAL 24SOIC | 74F | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | ||
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|
|
見積もりを取得 |
1,743
在庫あり
|
NXP USA Inc. | IC BUFFER/DRIVER OCTAL 24SOIC | 74F | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SO | 4.5 V ~ 5.5 V | 8 | Buffer/Driver with Parity | ||
|
|
|
見積もりを取得 |
1,519
在庫あり
|
Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||
|
|
|
見積もりを取得 |
1,244
在庫あり
|
Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 160-NFBGA (9x13) | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | ||
|
|
|
見積もりを取得 |
2,517
在庫あり
|
Texas Instruments | IC 10-BIT SCAN PORT XCVR 24-SOIC | 74LVT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 10 | Addressable Scan Ports | ||
|
|
|
見積もりを取得 |
3,029
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||
|
|
|
見積もりを取得 |
972
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,187
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||
|
|
|
見積もりを取得 |
2,307
在庫あり
|
Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||
|
|
|
見積もりを取得 |
2,015
在庫あり
|
Texas Instruments | IC TEST-BUS CONTROLLER 24-SOIC | 74LVT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 8 | Embedded Test-Bus Controllers | ||
|
|
|
見積もりを取得 |
3,401
在庫あり
|
Texas Instruments | IC 10-BIT SCAN PORT XCVR 24-SOIC | 74LVT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 2.7 V ~ 3.6 V | 10 | Addressable Scan Ports | ||
|
|
|
見積もりを取得 |
3,168
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,054
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 24SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,497
在庫あり
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
見積もりを取得 |
3,317
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
見積もりを取得 |
3,250
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
見積もりを取得 |
2,454
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||
|
|
|
見積もりを取得 |
3,808
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||
|
|
|
見積もりを取得 |
1,959
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Discontinued at Digi-Key | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||
|
|
|
見積もりを取得 |
2,312
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
見積もりを取得 |
3,215
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
見積もりを取得 |
2,580
在庫あり
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
見積もりを取得 |
750
在庫あり
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
見積もりを取得 |
2,452
在庫あり
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | ||
|
|
|
見積もりを取得 |
1,875
在庫あり
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | ||
|
|
|
見積もりを取得 |
2,047
在庫あり
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | ||
|
|
|
見積もりを取得 |
2,638
在庫あり
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24-SOIC | 74AS | Obsolete | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | ||
|
|
|
見積もりを取得 |
1,328
在庫あり
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
見積もりを取得 |
1,328
在庫あり
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
見積もりを取得 |
2,704
在庫あり
|
Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers |
