- シリーズ :
- 作動温度 :
- 供給装置パッケージ :
24 プロダクト
| 絵 | モデル | 価格 | 数量 | 株式 | メーカー | 説明 | シリーズ | 状態 | 包装 | 作動温度 | マウントタイプ | パッケージ/ケース | 供給装置パッケージ | 供給電圧 | ビット数 | 論理タイプ | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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見積もりを取得 |
2,850
在庫あり
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SO | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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|
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見積もりを取得 |
1,356
在庫あり
|
NXP USA Inc. | IC 9BIT DUAL LATCH TXRX 28SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SO | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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|
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見積もりを取得 |
3,665
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Digi-Reel® | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
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見積もりを取得 |
1,958
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
3,125
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
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見積もりを取得 |
3,699
在庫あり
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tube | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||
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|
|
見積もりを取得 |
2,653
在庫あり
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Discontinued at Digi-Key | Digi-Reel® | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||
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|
|
見積もりを取得 |
1,760
在庫あり
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Discontinued at Digi-Key | Cut Tape (CT) | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||
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|
|
見積もりを取得 |
2,194
在庫あり
|
Texas Instruments | IC SCAN-PATH LINKER 28-SOIC | 74ACT | Active | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 4 | SCAN-PATH LINKERS | ||
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|
|
見積もりを取得 |
3,543
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
1,269
在庫あり
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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|
|
見積もりを取得 |
3,911
在庫あり
|
ON Semiconductor | TXRX W/GENERATOR&CHECKER 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 9 | Parity Generator/Checker | ||
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|
|
見積もりを取得 |
2,546
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Obsolete | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
3,420
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
2,670
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
3,901
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
3,828
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
1,719
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
1,015
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
1,806
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
見積もりを取得 |
3,402
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
983
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 28-SOIC | 74ABT | Obsolete | Tape & Reel (TR) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
3,690
在庫あり
|
Texas Instruments | IC SCAN TEST DEV/TXRX 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
見積もりを取得 |
3,330
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 74ABT | Active | Tube | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceiver and Registers |
