- シリーズ :
- 作動温度 :
- 供給電圧 :
- 論理タイプ :
-
- 8-Bit to 9-Bit Parity Bus Transceiver (1)
- Arithmetic Logic Unit (3)
- Driver/Receiver (2)
- Scan Test Device with Buffers (2)
- Scan Test Device with Bus Transceivers (2)
- Scan Test Device with D-Type Edge-Triggered Flip-Flops (2)
- Scan Test Device with D-Type Latches (1)
- Scan Test Device with Inverting Buffers (2)
15 プロダクト
絵 | モデル | 価格 | 数量 | 株式 | メーカー | 説明 | シリーズ | 状態 | 包装 | 作動温度 | マウントタイプ | パッケージ/ケース | 供給装置パッケージ | 供給電圧 | ビット数 | 論理タイプ | |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
見積もりを取得 |
3,466
在庫あり
|
ON Semiconductor | IC ARITHMETIC LOGIC 4BIT 24-DIP | 74F | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 4 | Arithmetic Logic Unit | |||
|
見積もりを取得 |
1,666
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
見積もりを取得 |
1,188
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
見積もりを取得 |
806
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
見積もりを取得 |
846
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
|
見積もりを取得 |
3,810
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
|
見積もりを取得 |
2,817
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
|
見積もりを取得 |
2,739
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
|
見積もりを取得 |
3,609
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
見積もりを取得 |
2,795
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
見積もりを取得 |
3,663
在庫あり
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
|
見積もりを取得 |
2,075
在庫あり
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24DIP | 74AS | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
|
見積もりを取得 |
3,881
在庫あり
|
Texas Instruments | IC ARITHMETIC LOGIC UNIT 24DIP | 74AS | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | - | Arithmetic Logic Unit | |||
|
見積もりを取得 |
3,026
在庫あり
|
ON Semiconductor | IC DRIVER/RCVR QUAD BUS 24-DIP | 10H | Obsolete | Tube | 0°C ~ 75°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | - | 4 | Driver/Receiver | |||
|
見積もりを取得 |
3,483
在庫あり
|
ON Semiconductor | IC DRIVER/RCVR QUAD BUS 24-DIP | 10H | Obsolete | Tube | 0°C ~ 75°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | - | 4 | Driver/Receiver |