グローバルなメーカーとサプライヤーが信頼できる取引プラットフォームを構築する。
18 プロダクト
モデル 価格 数量 株式 メーカー 説明 シリーズ 状態 包装 作動温度 マウントタイプ パッケージ/ケース 供給装置パッケージ 供給電圧 ビット数 論理タイプ
74F181SPC
見積もりを取得
RFQ
3,466
在庫あり
ON Semiconductor IC ARITHMETIC LOGIC 4BIT 24-DIP 74F Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 4 Arithmetic Logic Unit
74F181PC
見積もりを取得
RFQ
3,476
在庫あり
ON Semiconductor IC ARITHMETIC LOGIC 4BIT 24-DIP 74F Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.600", 15.24mm) 24-PDIP 4.5 V ~ 5.5 V 4 Arithmetic Logic Unit
SN74BCT8374ANTG4
見積もりを取得
RFQ
1,666
在庫あり
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ANT
見積もりを取得
RFQ
1,188
在庫あり
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8373ANT
見積もりを取得
RFQ
806
在庫あり
Texas Instruments IC SCAN TEST DEVICE LATCH 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Latches
SN74BCT8245ANTG4
見積もりを取得
RFQ
846
在庫あり
Texas Instruments IC SCAN TEST DEVICE TXRX 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Bus Transceivers
SN74BCT8245ANT
見積もりを取得
RFQ
3,810
在庫あり
Texas Instruments IC SCAN TEST DEVICE TXRX 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Bus Transceivers
SN74BCT8244ANTG4
見積もりを取得
RFQ
2,817
在庫あり
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Buffers
SN74BCT8244ANT
見積もりを取得
RFQ
2,739
在庫あり
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Buffers
SN74BCT8240ANTG4
見積もりを取得
RFQ
3,609
在庫あり
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers
SN74BCT8240ANT
見積もりを取得
RFQ
2,795
在庫あり
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 Scan Test Device with Inverting Buffers
SN74BCT29854NT
見積もりを取得
RFQ
3,663
在庫あり
Texas Instruments IC TRANSCEIVER 1-9BIT 24DIP 74BCT Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V 8 8-Bit to 9-Bit Parity Bus Transceiver
SN74AS181ANTG4
見積もりを取得
RFQ
2,075
在庫あり
Texas Instruments IC ARITHMETIC LOGIC UNIT 24DIP 74AS Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V - Arithmetic Logic Unit
SN74AS181ANT
見積もりを取得
RFQ
3,881
在庫あり
Texas Instruments IC ARITHMETIC LOGIC UNIT 24DIP 74AS Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP 4.5 V ~ 5.5 V - Arithmetic Logic Unit
MC10H330PG
見積もりを取得
RFQ
3,026
在庫あり
ON Semiconductor IC DRIVER/RCVR QUAD BUS 24-DIP 10H Obsolete Tube 0°C ~ 75°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP - 4 Driver/Receiver
MC10H330P
見積もりを取得
RFQ
3,483
在庫あり
ON Semiconductor IC DRIVER/RCVR QUAD BUS 24-DIP 10H Obsolete Tube 0°C ~ 75°C Through Hole 24-DIP (0.300", 7.62mm) 24-PDIP - 4 Driver/Receiver
SN74LS181NG4
見積もりを取得
RFQ
3,432
在庫あり
Texas Instruments IC ARTHMTC UNIT/FUN GEN 24-DIP 74LS Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.600", 15.24mm) 24-PDIP 4.75 V ~ 5.25 V - Arithmetic Logic Unit
SN74LS181N
見積もりを取得
RFQ
3,971
在庫あり
Texas Instruments IC ARTHMTC UNIT/FUN GEN 24-DIP 74LS Obsolete Tube 0°C ~ 70°C Through Hole 24-DIP (0.600", 15.24mm) 24-PDIP 4.75 V ~ 5.25 V - Arithmetic Logic Unit