- 作動温度 :
- 論理タイプ :
-
- 1:1, 1:2 Configurable Registered Buffer with Parity (1)
- 1:2 Configurable Registered Buffer with Parity (1)
- 1:2 Registered Buffer with Parity (2)
- ABT Scan Test Device With Transceivers and Registers (5)
- ABT Scan Test Device With Universal Bus Transceivers (7)
- Comparator, Driver (3)
- Differential Receiver/Driver (1)
- Linking Addressable Scan Ports (2)
- LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line (1)
- Registered Buffer with SSTL_2 Compatible I/O for DDR (1)
- Scan Test Device with Registered Bus Transceiver (1)
- Scan Test Device With Transceivers And Registers (6)
- Scan Test Device with Universal Bus Transceivers (2)
- TTL/BTL Transceiver/Translator (1)
- TTL/BTL Universal Storage Transceiver (1)
- 選択したフィルタ :
36 プロダクト
| 絵 | モデル | 価格 | 数量 | 株式 | メーカー | 説明 | シリーズ | 状態 | 包装 | 作動温度 | マウントタイプ | パッケージ/ケース | 供給装置パッケージ | 供給電圧 | ビット数 | 論理タイプ | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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見積もりを取得 |
2,090
在庫あり
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Maxim Integrated | IC DCL QUAD 300MHZ ATE 80TQFP | ATE | Active | Tray | 0°C ~ 70°C | Surface Mount | 80-TQFP Exposed Pad | 80-TQFP-EP (12x12) | -1 V ~ 5.2 V | 4 | Comparator, Driver | ||
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見積もりを取得 |
1,896
在庫あり
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Maxim Integrated | IC DCL DUAL 500MBPS ATE 100TQFP | ATE | Active | Tray | 0°C ~ 70°C | Surface Mount | 100-TQFP Exposed Pad | 100-TQFP-EPR (14x14) | -1.5 V ~ 6.5 V | 2 | Comparator, Driver | ||
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見積もりを取得 |
813
在庫あり
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Maxim Integrated | IC COMPARATOR R-R 80TQFP | ATE | Active | Tray | 0°C ~ 70°C | Surface Mount | 80-TQFP Exposed Pad | 80-TQFP-EP (12x12) | -2.2 V ~ 5.2 V | 4 | Comparator, Driver | ||
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見積もりを取得 |
1,099
在庫あり
|
Texas Instruments | IC 18-BIT TTL/BTL XCVR 100-HLQFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) | 4.5 V ~ 5.5 V | 18 | TTL/BTL Universal Storage Transceiver | ||
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見積もりを取得 |
2,008
在庫あり
|
Texas Instruments | IC 17BIT UNIV STRG XCVR 100HLQFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 100-LQFP Exposed Pad | 100-HLQFP (14x14) | 4.5 V ~ 5.5 V | 17 | LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line | ||
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見積もりを取得 |
3,509
在庫あり
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Texas Instruments | IC TXRX 8BIT TTL/BTL 52-QFP | 74FB | Active | Tray | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) | 4.5 V ~ 5.5 V | 8 | TTL/BTL Transceiver/Translator | ||
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見積もりを取得 |
3,479
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 18BIT 64LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
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見積もりを取得 |
2,075
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
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見積もりを取得 |
3,173
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
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見積もりを取得 |
2,859
在庫あり
|
Texas Instruments | IC SCAN TEST DEVICE 20BIT 64LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 20 | Scan Test Device with Universal Bus Transceivers | ||
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見積もりを取得 |
1,966
在庫あり
|
Texas Instruments | NON-STANDARD PART CALL FIRST | - | Active | Tray | - | - | - | - | - | - | - | ||
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見積もりを取得 |
728
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
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|
見積もりを取得 |
2,042
在庫あり
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Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Universal Bus Transceivers | ||
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見積もりを取得 |
2,813
在庫あり
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Texas Instruments | IC LINK ADDRSS SCAN-PORT 64-BGA | 74LVT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LFBGA | 64-BGA MICROSTAR (8x8) | 2.7 V ~ 3.6 V | - | Linking Addressable Scan Ports | ||
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|
見積もりを取得 |
737
在庫あり
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Texas Instruments | IC 20BIT UNIV BUS TXRX 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 20 | ABT Scan Test Device With Universal Bus Transceivers | ||
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見積もりを取得 |
2,457
在庫あり
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IDT, Integrated Device Technology Inc | IC BUFFER 14BIT REG DDR2 150-BGA | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 150-TFBGA | 150-CABGA (8x13) | 1.7 V ~ 1.9 V | 14 | 1:2 Registered Buffer with Parity | ||
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|
見積もりを取得 |
2,006
在庫あり
|
IDT, Integrated Device Technology Inc | IC BUFFER 28BIT 1:2 REG 160-BGA | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 160-LFBGA | 160-CABGA (9x13) | 1.7 V ~ 1.9 V | 28 | 1:2 Registered Buffer with Parity | ||
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見積もりを取得 |
2,429
在庫あり
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IDT, Integrated Device Technology Inc | IC BUFFR 28BIT REG DDR2 176-BGA | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 176-TFBGA | 176-CABGA (6x15) | 1.7 V ~ 1.9 V | 28 | 1:2 Configurable Registered Buffer with Parity | ||
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見積もりを取得 |
2,716
在庫あり
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IDT, Integrated Device Technology Inc | IC BUFFER 25BIT REG DDR2 96-BGA | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-CABGA (13.5x5.5) | 1.7 V ~ 1.9 V | 25, 14 | 1:1, 1:2 Configurable Registered Buffer with Parity | ||
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見積もりを取得 |
2,480
在庫あり
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IDT, Integrated Device Technology Inc | IC BUFFER DDR 13-26BIT 56VFQFPN | - | Active | Tray | 0°C ~ 70°C | Surface Mount | 56-VFQFN Exposed Pad | 56-VFQFPN (8x8) | 2.3 V ~ 2.7 V | 13, 26 | Registered Buffer with SSTL_2 Compatible I/O for DDR | ||
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見積もりを取得 |
763
在庫あり
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ON Semiconductor | IC RCVR/DRVR HEX DIFF ECL 32LQFP | 100EP | Active | Tray | -40°C ~ 85°C | Surface Mount | 32-LQFP | 32-LQFP (7x7) | 3 V ~ 5.5 V | 6 | Differential Receiver/Driver | ||
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見積もりを取得 |
1,771
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Registered Bus Transceiver | ||
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見積もりを取得 |
3,544
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
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見積もりを取得 |
2,346
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
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|
見積もりを取得 |
3,989
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABT | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
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|
見積もりを取得 |
1,253
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
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|
見積もりを取得 |
1,851
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/TXRX 64-LQFP | 74ABTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 4.5 V ~ 5.5 V | 18 | Scan Test Device With Transceivers And Registers | ||
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|
|
見積もりを取得 |
1,952
在庫あり
|
Texas Instruments | IC TXRX/REG 18BIT 3.3V 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
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|
|
見積もりを取得 |
854
在庫あり
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Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers | ||
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|
|
見積もりを取得 |
3,631
在庫あり
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 64-LQFP | 74LVTH | Active | Tray | -40°C ~ 85°C | Surface Mount | 64-LQFP | 64-LQFP (10x10) | 2.7 V ~ 3.6 V | 18 | ABT Scan Test Device With Transceivers and Registers |
